Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray (EDX) microanalysis
The Geo Laboratory at the Natural History Museum (NHM-UiO) is equipped with a ZEISS Sigma 360 Scanning Electron Microscope (SEM), installed in 2024, which is suitable for high-resolution imaging of geological materials (minerals, microfossils) and semi-quantitative X-ray microanalysis of both conductive and non-conductive specimens.
Instrument installation in progress - updated information coming soon
Instrument Features
Examples of images
Sample Preparation Equipment
Electrically insulating samples may be coated with a thin layer of conducting material to prevent charging effects. The choice of material depends on the data to be acquired; carbon is most desirable for elemental analysis, while metal coatings are most effective for high-resolution imaging.
- Agar Auto Carbon Coater
- Jeol Fine Coat Ion Sputter JFC-1100, with a PtPd metal alloy target
Tags:
SEM,
BSE,
EDX,
EDS,
variable pressure,
mineralogy,
paleontology,
microanalyses
Published Feb. 12, 2019 9:15 AM
- Last modified June 19, 2024 10:06 AM